The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Mar. 13, 2020
Carl Zeiss Microscopy Gmbh, Jena, DE;
Stanislav Kalinin, Weimar, DE;
Volodymyr Kudryavtsev, Jena, DE;
Thomas Egloff, Jena, DE;
Wolfgang Bathe, Jena, DE;
Benedikt Lübbers, Erfurt, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Px), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Px) and a row sum is formed in each case. A correction value of the pixel (Px) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Px), of the reconstructed image, as a result of which a corrected image is obtained.