The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Aug. 26, 2020
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Hemant Nautiyal, Noida, IN;

Jehoda Refaeli, Austin, TX (US);

Ankush Sethi, Austin, TX (US);

Shreya Singh, Ranchi, IN;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0724 (2013.01); G06F 11/0775 (2013.01); G06F 11/0793 (2013.01);
Abstract

A fault collection and reaction system on a system-on-chip (SoC) includes a plurality of reaction cores assigned to a plurality of applications being executed by a plurality of processor cores on the SoC, at least one look-up table (LUT), and a controller. The at least one LUT stores therein a first mapping between the plurality of reaction cores and corresponding plurality of domain identifiers, and a second mapping between a plurality of faults and a set of reaction combinations. The controller receives a fault indication and a first domain identifier in response to occurrence of a first fault and selects from the plurality of reaction cores, a first reaction core mapped to the first domain identifier, and from the set of reaction combinations, a first reaction combination mapped to the first fault. The first reaction core responds to the fault indication with a reaction based on the selected reaction combination.


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