The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Jan. 06, 2020
Yuasa System Co., Ltd., Okayama, JP;
Tokyo Institute of Technology, Tokyo, JP;
Atsushi Shishido, Tokyo, JP;
Norihisa Akamatsu, Tokyo, JP;
Ryo Taguchi, Tokyo, JP;
Yoshihito Ota, Okayama, JP;
Hisao Sasaki, Okayama, JP;
Yasuhisa Okazaki, Okayama, JP;
Yuasa System Co., LTD., Tokyo, JP;
Abstract
Provide is a deformation testing apparatus in which a sign of breakage of a specimen under a deformation test can be detected before an actual breakage. The deformation testing apparatus carrying out a plurality of deformation cycles includes an image capturing means; reference data storing means storing the reference data showing the deformation state calculated based on the reference image data shot by the image capturing means; reference cycle number deformation data calculating means to calculate the reference data; detection cycle number deformation data calculating means to calculate detection cycle number deformation data showing the deformation state based on the detection image data shot at the detection cycle number being larger than the reference cycle number; and change detection means to detect that the deformation caused in the specimen is changed based on the reference cycle number deformation data and the detection cycle number deformation data.