The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Oct. 28, 2020
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventor:

Yoshiaki Kato, Chiba, JP;

Assignee:

MITUTOYO CORPORATION, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01); G01D 5/20 (2006.01);
U.S. Cl.
CPC ...
G01D 5/204 (2013.01);
Abstract

A scale capable of maintaining measurement accuracy even if the pattern of the scale pattern is scratched is provided. The scalecomprises a scale patternhaving a plurality of unit patterns provided at a predetermined pitch along the measurement direction on a surface thereof. At least one of the plurality of unit patterns comprises a plurality of loop portionsformed with conductors in a loop shape. The plurality of loop portionsincluded in the unit pattern are arranged so as to be spaced from each other such that the centers of gravity of the loop portionsare at the same position in the measurement direction on the surface of the scale. Thereby, the plurality of loop portionsincluded in the unit pattern can prevent deviation of the center of gravity of the magnetic flux distribution in the measurement direction, even if any of the plurality of the loop portionsis scratched. Therefore, the scalecan maintain the measurement accuracy.


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