The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Aug. 26, 2020
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Scott Janus, Loomis, CA (US);

Prasoonkumar Surti, Folsom, CA (US);

Karthik Vaidyanathan, San Francisco, CA (US);

Alexey Supikov, San Jose, CA (US);

Gabor Liktor, San Francisco, CA (US);

Carsten Benthin, Voelklingen, DE;

Philip Laws, Santa Clara, CA (US);

Michael Doyle, Santa Clara, CA (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 17/00 (2006.01); G06T 1/60 (2006.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 1/60 (2013.01); G06T 15/005 (2013.01); G06T 17/005 (2013.01); G06T 2210/21 (2013.01);
Abstract

Apparatus and method for a hierarchical beam tracer. For example, one embodiment of an apparatus comprises: a beam generator to generate beam data associated with a beam projected into a graphics scene; a bounding volume hierarchy (BVH) generator to generate BVH data comprising a plurality of hierarchically arranged BVH nodes; a hierarchical beam-based traversal unit to determine whether the beam intersects a current BVH node and, if so, to responsively subdivide the beam into N child beams to test against the current BVH node and/or to traverse further down the BVH hierarchy to select a new BVH node, wherein the hierarchical beam-based traversal unit is to iteratively subdivide successive intersecting child beams and/or to continue to traverse down the BVH hierarchy until a leaf node is reached with which at least one final child beam is determined to intersect; the hierarchical beam-based traversal unit to generate a plurality of rays within the final child beam; and intersection hardware logic to perform intersection testing for any rays intersecting the leaf node, the intersection testing to determine intersections between the rays intersecting the leaf node and primitives bounded by the leaf node.


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