Dynamic thermal management simulation using improved reduced order modeling

Abstract

Methods and systems are described that improve simulations which use thermal models to test dynamic thermal mitigation of devices, such as smartphones. These methods and systems can use a thermal Reduced Order Model (ROM) that is trained through machine learning to provide efficient systems that can significantly reduce the time and computational resources required to build a simulation of a device's thermal behavior. The thermal model can be used in different usage scenarios with different power management and thermal management controls to test the device's thermal behavior.