The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Nov. 08, 2017
Applicant:
Dalian University of Technology, Liaoning, CN;
Inventors:
Ping Zhou, Liaoning, CN;
Ning Huang, Liaoning, CN;
Renke Kang, Liaoning, CN;
Dongming Guo, Liaoning, CN;
Ying Yan, Liaoning, CN;
Assignee:
DALIAN UNIVERSITY OF TECHNOLOGY, Liaoning, CN;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1056 (2013.01);
Abstract
A nanometer cutting depth high-speed single-point scratch test device includes a workbench, an air-bearing turntable, a test piece fixture, a test piece, a Z-direction feeding device, a nano positioning stage, a force sensor and a scratch tool. A micro convex structure with controllable length and height is machined in a position of the test piece to be scratched.