The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Jan. 29, 2020
Bruker Nano, Inc., San Jose, CA (US);
Jair Giovanni Ramirez Gonzalez, San Jose, CA (US);
Vladimir Gulkov, San Jose, CA (US);
Steven J. Shaffer, San Jose, CA (US);
Douglas Werner, San Jose, CA (US);
BRUKER NANO INC., San Jose, CA (US);
Abstract
System for conducting measurements of friction of a chosen material with reduced errors. The system includes a sample holder, a bushing accommodating such holder while permitting reversible repositioning of the holder along a bushing axis, a horizontal force sensor, a vertical force sensor, a sample holder pusher and a subsystem including a linear vertical bearing (disposed in the bushing and separating the holder from the bushing) and/or a horizontally-sliding element between the rod pusher and the vertical force sensor. The subsystem is structured to reduce a rocking motion of the holder in the bushing caused by a relative motion between the sample and an auxiliary body brought in contact with the sample. The method for performing measurements with such system.