The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Apr. 30, 2020
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventor:

Jin Jisong, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/033 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0338 (2013.01); H01L 21/0332 (2013.01); H01L 21/0335 (2013.01); H01L 21/0337 (2013.01);
Abstract

A semiconductor structure and a forming method thereof are provided. The forming method includes: providing a base, where the base includes a first region; forming a bottom core material layer on the base; forming separate first core layers on the bottom core material layer of the first region; forming a first spacer on a side wall of the first core layer; removing the first core layer; after removing the first core layer, forming a second spacer on a side wall of the first spacer, where the first spacer and the second spacer located on the side wall of the first spacer constitute a main spacer structure layer; patterning the bottom core material layer by using the main spacer structure layer as a masking film to form a second core layer; removing the main spacer structure layer; after removing the main spacer structure layer, forming a third spacer on a side wall of the second core layer; removing the second core layer; and after removing the second core layer, patterning the base by using the third spacer as a masking film to form a desired pattern. Embodiments of the present disclosure can meet the demand of different types of pitches between the desired patterns, and are beneficial to accurately controlling the pitches between the desired patterns.


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