The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Aug. 27, 2021
Applicants:

Bonnie Berger Leighton, Newtonville, MA (US);

Maxwell Aaron Sherman, Marblehead, MA (US);

Adam Uri Yaari, Cambridge, MA (US);

Inventors:

Bonnie Berger Leighton, Newtonville, MA (US);

Maxwell Aaron Sherman, Marblehead, MA (US);

Adam Uri Yaari, Cambridge, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06N 3/08 (2006.01); G16B 20/20 (2019.01); G16B 40/00 (2019.01); G16B 5/20 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2462 (2019.01); G06N 3/08 (2013.01); G16B 5/20 (2019.02); G16B 20/20 (2019.02); G16B 40/00 (2019.02);
Abstract

An activity of interest is modeled by a non-stationary discrete stochastic process, such as a pattern of mutations across a cancer genome. Initially, input genomic data is used to train a model to predict rate parameters and their associated uncertainty estimation for each of a set of process regions. For any arbitrary set of indexed positions of the stochastic process that are identified in an information query, the rate parameters and their associated estimation uncertainties are scaled using the model to obtain a distribution of the events of interest and their associated estimation uncertainties for the set of indexed positions. In one practical application, and in response to a search query associated with one or more base-pairs, a result is then returned. The result, which represents deviations between the estimated and observed mutation rates, is used to identify genomic elements that have more mutations than expected and therefore constitute previously unknown driver mutations.


Find Patent Forward Citations

Loading…