The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2022
Filed:
May. 15, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for generating and analyzing an overview contrast image of a specimen carrier and/or of specimens situated on a specimen carrier. A specimen carrier arranged at least partially in the focus of a detection optical unit is illuminated in transmitted light using a two-dimensional, array-like illumination pattern. At least two overview raw images are detected using different illuminations of the specimen carrier, and, according to information to be extracted from the overview contrast image, a combination algorithm is selected by means of which the at least two overview raw images are combined to form the overview contrast image. According to information to be extracted from the overview contrast image, an image evaluation algorithm is selected by means of which the information is extracted.