The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2022

Filed:

Jun. 12, 2019
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Lawrence A. Bush, Shelby Township, MI (US);

Michael A. Losh, Rochester Hills, MI (US);

Aravindhan Mani, Troy, MI (US);

Upali P. Mudalige, Oakland Township, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/32 (2006.01); G01C 21/36 (2006.01);
U.S. Cl.
CPC ...
G01C 21/32 (2013.01); G01C 21/3617 (2013.01); G01C 21/3644 (2013.01);
Abstract

A system for generating a map includes a processing device configured to determine a provenance of each received map of a plurality of maps, parse each received map into objects of interest, and compare the objects of interest to identify one or more sets of objects representing a common feature. For each set of objects, the processing device is configured to select a subset of the set of objects based on the provenance associated with each object in the set of objects, and calculate a similarity metric for each object in the subset. The similarity metric is selected from an alignment between an object and a reference object in the subset, and/or a positional relationship between the object and the reference object. The processing device is configured to generate a common object representing the common feature based on the similarity metric, and generate a merged map including the common object.


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