The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Mar. 17, 2021
Carl Zeiss Microscopy Gmbh, Jena, DE;
Michael Goegler, Wolfratshausen, DE;
Juergen Fechti, Goettingen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A microscope and a microscopy method for imaging an object, wherein use is made of a microscope comprising an objective which defines an optical axis and a focal plane perpendicular thereto, and an adjustable correction optical unit which, at the objective, corrects a spherical aberration occurring when imaging the object with a certain depth position of the focal plane. The method comprises the following steps: determining an actual type of object; reading a database in which refractive indices of different types of objects are stored in order to determine the refractive index of the object; using a relationship between the refractive index and the spherical aberration caused by the object in order to ascertain an adjustment value of the correction optical unit such that there is a reduction in the spherical aberration in the focal plane; adjusting the correction optical unit to the adjustment value; and imaging the object.