The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Jun. 29, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Jörg Siebenmorgen, Jena, DE;
Thomas Kalkbrenner, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for adjusting a specimen holder in the beam path of a microscope, in which at least one beam of an illumination radiation is directed onto the specimen holder; a component of the illumination radiation reflected by the specimen holder is captured by means of a detector and measurement values of the captured illumination radiation are ascertained. A current actual manner of positioning of the specimen holder in relation to the beam path is established depending on the measurement values; the established actual manner of positioning is compared to an intended manner of positioning, and control commands for modifying the actual manner of positioning are produced, the execution of which causes the specimen holder to be moved into the intended manner of positioning.