The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Jun. 25, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Ankita Patidar, San Jose, CA (US);

Sandeep Kumar Goel, Dublin, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G11C 29/44 (2006.01); G11C 29/12 (2006.01); G11C 29/10 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01); G01R 31/3185 (2006.01); G06F 11/07 (2006.01); G01R 31/28 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G01R 31/318342 (2013.01); G01R 31/318547 (2013.01); G11C 29/02 (2013.01); G11C 29/10 (2013.01); G11C 29/12005 (2013.01); G11C 29/50004 (2013.01); G01R 31/2837 (2013.01); G01R 31/31813 (2013.01); G06F 11/079 (2013.01);
Abstract

A method of identifying cell-internal defects: obtaining a circuit design of an integrated circuit, the circuit design including netlists of one or more cells coupled to one another; identifying the netlist corresponding to one of the one or more cells; injecting a defect to one of a plurality of circuit elements and one or more interconnects of the cell; retrieving a first current waveform at a location of the cell where the defect is injected by applying excitations to inputs of the cell; retrieving, without the defect injected, a second current waveform at the location of the cell by applying the same excitations to the inputs of the cell; and selectively annotating, based on the first current waveform and the second current waveform, an input/output table of the cell with the defect.


Find Patent Forward Citations

Patidar, Ankita. (2022). Systems and methods to detect cell-internal defects (U.S. Patent No. 11295831). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11295831

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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