The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Feb. 10, 2020
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Yu-Der Chih, Hsinchu, TW;
Chia-Fu Lee, Hsinchu, TW;
Chien-Yin Liu, Hsinchu, TW;
Yi-Chun Shih, Taipei, TW;
Kuan-Chun Chen, Hsinchu, TW;
Hsueh-Chih Yang, Hsinchu, TW;
Shih-Lien Linus Lu, Hsinchu, TW;
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu, TW;
Abstract
A method of screening weak bits in a memory array. The method includes storing a first set of data in a first memory array of the memory array, performing a first baking process on at least the first memory array or applying a first magnetic field to at least the first memory array, tracking an address of at least a first memory cell of a first set of memory cells of the first memory array, if the first memory cell of the first set of memory cells stores altered data, and at least one of replacing the first memory cell of the first set of memory cells storing the altered data with a corresponding memory cell in a second memory array of the memory array, or discarding the first memory cell of the first set of memory cells storing the altered data.