The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Nov. 11, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Harish R. Singidi, Fremont, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Gianni S. Alsasua, Rancho Cordova, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/406 (2006.01); G11C 11/408 (2006.01); G11C 11/409 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 11/40622 (2013.01); G11C 11/409 (2013.01); G11C 11/4085 (2013.01); G11C 29/44 (2013.01);
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including identifying, among a first plurality of wordlines of a set of pages of the memory device, at least one wordline having a current value of a data state metric satisfying a first condition; determining new values of the data state metric of a second plurality of wordlines of the set of pages, wherein the at least one wordline is excluded from the second plurality of wordlines; and responsive to determining that the new values of the data state metric of one or more wordlines of the second plurality of wordlines satisfy a second condition, performing a media management operation with respect to the one or more wordlines.


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