The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Dec. 23, 2020
Intel Corporation, Santa Clara, CA (US);
Avigdor Eldar, Jerusalem, IL;
Intel Corporation, Santa Clara, CA (US);
Abstract
An example system disclosed herein includes a camera to: capture a first image set of a first view of an object when the camera is in a first position, the first image set including first infrared data and first RGB data; capture a second image set of a second view of the object when the camera is in a second position, the second image set including second infrared data and second RGB data; and capture a third image set of a third view of the object when the camera is in a third position, the third image set including third infrared data and third RGB data. The example system also includes at least one processor to: identify a plurality of features among the first view, the second view, and the third view; align the second view relative to the first view by using one or more of the features; align the third view relative to the first view by using one or more of the features; determine first three-dimensional data from the first infrared data; determine second three-dimensional data from the second infrared data; determine third three-dimensional data from the third infrared data; average the first three-dimensional data, the second three-dimensional data, and the third three-dimensional data; create a calibration model based on the average; determine a refined view based on the calibration model; and compute a three dimensional to two dimensional projection based on the refined view.