The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Oct. 14, 2016
Carl Zeiss Microscopy Gmbh, Jena, DE;
Thomas Ohrt, Golmsdorf, DE;
Thomas Kalkbrenner, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
Specimen delimiting element which, at least in one region, has a nano-porous material which is transparent to at least one observation radiation which is capturable by means of a microscope. The nano-porous material has pores, the mean pore diameter of which is smaller than the wavelength of the observation radiation, and a proportion of at least 5% of the volume of the nano-porous material is taken up by the pores at least in portions of said nano-porous material. The material has an open porosity, the mean pore diameter is at most 1000 nm, and the number of pores per unit volume of the nano-porous material and/or the mean pore diameter changes/change along at least one extent of the specimen delimiting element, such that a pore gradient is formed in the specimen delimiting element, and has at least one gradient portion in which no porosity is present, such that a separation of a specimen medium on one side surface of the specimen delimiting element and an immersion medium on an opposite side surface of the specimen delimiting element is effected by means of the specimen delimiting element. The invention furthermore relates to a microscopy method and to a microscope using the specimen delimiting element.