The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Jul. 31, 2020
Applicant:
Asm Technology Singapore Pte Ltd, Singapore, SG;
Inventors:
Shun Yan Lee, Hong Kong, HK;
Sai Kit Wong, Hong Kong, HK;
Chi Wah Yuen, Hong Kong, HK;
Ka Yee Mak, Hong Kong, HK;
Gary Peter Widdowson, Hong Kong, HK;
Assignee:
ASM TECHNOLOGY SINGAPORE PTE LTD, Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 33/00 (2010.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
H01L 22/14 (2013.01); H01L 22/22 (2013.01); H01L 22/24 (2013.01); H01L 22/30 (2013.01); H01L 33/005 (2013.01); G01R 31/2635 (2013.01); H01L 2933/0066 (2013.01);
Abstract
A pick and place LED testing apparatus, comprising: a test station operative in use to power a group of LEDs; a bondhead operative in use to pick said group of LEDs from a source wafer and place said group of LEDs on said test station for testing; and an optical sensor operative in use to measure an optical characteristic of said group of LEDs when tested, wherein at least a portion of said bondhead is translucent to provide an optical path from said group of LEDs to said optical sensor.