The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Jan. 30, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andreas H. A. Arp, Nufringen, DE;

Douglas J. Malone, Pleasant Valley, NY (US);

Thomas Makowski, Pfullingen, DE;

Michael V. Koch, Ehningen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); H03K 3/037 (2006.01); H03K 19/20 (2006.01); H04L 7/00 (2006.01); G06F 1/10 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01); G06F 1/10 (2013.01); H03K 3/037 (2013.01); H03K 5/00 (2013.01); H03K 19/20 (2013.01); H04L 7/0037 (2013.01); H03K 2005/00019 (2013.01);
Abstract

Measuring a control system response time of a second clock tree is provided, comprising measuring a skew between the second clock signal and the first clock signal and storing the skew, initiating a delay change of a delay induced by the programmable delay line and starting a time measurement. At least one iteration is performed of measuring the skew between the second clock signal and the first clock signal and comparing the measured skew with the stored skew. Based on the result of the comparison, stopping after a current iteration and stopping the time measurement. A result of the time measurement is the control system response time.


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