The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

Sep. 21, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Hui-Ting Lu, Zhudong Township, TW;

Pei-Lun Wang, Zhubei, TW;

Yu-Chang Jong, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 29/78 (2006.01); H01L 23/495 (2006.01); H01L 29/66 (2006.01); H01L 21/761 (2006.01); H01L 29/417 (2006.01); H01L 23/485 (2006.01); H01L 29/10 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7816 (2013.01); H01L 21/761 (2013.01); H01L 23/485 (2013.01); H01L 23/49562 (2013.01); H01L 23/49575 (2013.01); H01L 29/402 (2013.01); H01L 29/407 (2013.01); H01L 29/4175 (2013.01); H01L 29/66659 (2013.01); H01L 29/66681 (2013.01); H01L 29/66689 (2013.01); H01L 29/78 (2013.01); H01L 29/7835 (2013.01); H01L 29/0653 (2013.01); H01L 29/0692 (2013.01); H01L 29/1045 (2013.01); H01L 29/1087 (2013.01); H01L 29/665 (2013.01);
Abstract

The present disclosure, in some embodiments, relates to a method of forming an integrated chip. The method may be performed by forming a gate structure over a substrate and between a source region and a drain region. A composite etch stop structure is formed over the gate structure and a first inter-level dielectric (ILD) layer is formed over the composite etch stop structure. The composite etch stop structure has a plurality of stacked dielectric materials. The first ILD layer is etched to concurrently define contact openings extending to the substrate and a field plate opening extending to the composite etch stop structure. The contact openings and the field plate opening are concurrently filled with one or more conductive materials.


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