The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2022

Filed:

May. 19, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Gianni Stephen Alsasua, Rancho Cordova, CA (US);

Harish Reddy Singidi, Fremont, CA (US);

Peter Sean Feeley, Boise, ID (US);

Ashutosh Malshe, Fremont, CA (US);

Renato Padilla, Jr., Folsom, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Sampath Ratnam, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/064 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01); G11C 16/3422 (2013.01);
Abstract

Systems and methods are disclosed, comprising a memory device comprising multiple groups of memory cells, the groups comprising a first group of memory cells and a second group of memory cells configured to store information at a same bit capacity per memory cell, and a processing device operably coupled to the memory device, the processing device configured to adjust a scan event threshold for one of the first or second groups of memory cells to a threshold less than a target scan event threshold for the first and second groups of memory cells to distribute scan events in time on the memory device.


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