The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Jul. 30, 2018
Applicant:

Imec Vzw, Leuven, BE;

Inventor:

Juergen Boemmels, Heverlee, BE;

Assignee:

IMEC vzw, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11 (2006.01); H01L 21/8238 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 29/786 (2006.01); H01L 21/265 (2006.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/36 (2006.01); H01L 29/417 (2006.01); H01L 21/8234 (2006.01); H01L 21/02 (2006.01); H01L 21/027 (2006.01); H01L 21/28 (2006.01); H01L 21/306 (2006.01); H01L 21/321 (2006.01); H01L 21/3213 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1104 (2013.01); H01L 21/26513 (2013.01); H01L 21/823807 (2013.01); H01L 21/823828 (2013.01); H01L 21/823871 (2013.01); H01L 21/823885 (2013.01); H01L 29/0676 (2013.01); H01L 29/0847 (2013.01); H01L 29/1037 (2013.01); H01L 29/1079 (2013.01); H01L 29/36 (2013.01); H01L 29/41741 (2013.01); H01L 29/66719 (2013.01); H01L 29/66727 (2013.01); H01L 29/7802 (2013.01); H01L 29/7827 (2013.01); H01L 29/78642 (2013.01); H01L 29/78696 (2013.01); H01L 21/0228 (2013.01); H01L 21/0276 (2013.01); H01L 21/28088 (2013.01); H01L 21/30604 (2013.01); H01L 21/3212 (2013.01); H01L 21/32133 (2013.01); H01L 21/32139 (2013.01); H01L 21/823475 (2013.01); H01L 21/823487 (2013.01); H01L 21/823857 (2013.01); H01L 29/4966 (2013.01); H01L 29/66545 (2013.01);
Abstract

The disclosed technology generally relates to semiconductor devices, and more particularly to a static random access memory (SRAM) having vertical channel transistors and methods of forming the same. In an aspect, a semiconductor device includes a semiconductor substrate and a semiconductor bottom electrode region formed on the substrate and including a first region, a second region and a third region arranged side-by-side. The second region is arranged between the first and the third regions. A first vertical channel transistor, a second vertical channel transistor and a third vertical channel transistor are arranged on the first region, the second region and the third region, respectively. The first, second and third regions are doped such that a first p-n junction is formed between the first and the second regions and a second p-n junction is formed between the second and third regions. A connection region is formed in the bottom electrode region underneath the first, second and third regions, wherein the connection region and the first and third regions are doped with a dopant of a same type. A resistance of a path extending between the first and the third regions through the connection region is lower than a resistance of a path extending between the first and the third regions through the second region. A second aspect is a method of forming the semiconductor device of the first aspect.


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