The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Jun. 23, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Zhihui Wu, Kanagawa, JP;

Takumi Nakamura, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/15 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); H04B 17/15 (2015.01); H04B 17/29 (2015.01);
Abstract

In a measurement device, a reception sensitivity test control unit includes drop determination means for determining whether or not a measured throughput is in a dropped state to a preset proportion in a steep drop region in which the throughput drops steeply, and output level setting meansfor performing a setting process of setting an output level of the test signal to be different from a previous output level according to a comparison result indicating whether a throughput measurement result exceeds a predetermined threshold value and a determination result indicating whether the measured throughput is in the dropped state by the drop determination means, the setting process including a process of performing level down or level up on the output level of the test signal with respect to the previous output level in units of an error tolerance level EL when it is determined to be the dropped state.


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