The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Jun. 24, 2020
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Jianzhi Wu, Milpitas, CA (US);

Xiang Yang, Santa Clara, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 16/24 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 16/24 (2013.01); G11C 16/3404 (2013.01);
Abstract

A method and system are provided for reading a non-transitory memory array. When a default read operation is performed and has failed, a dynamic sensing bit line voltage (VBLC) enhanced read or a dynamic sense time read is performed. According to the dynamic VBLC enhanced read or the dynamic sense time enhanced read, the VBLC or the sense time is increased, and a read is performed with the increased VBLC or increased sense time. If this enhanced read is unsuccessful, and if a maximum VBLC or a maximum sense time has not yet been reached, the VBLC or the sense time is increased again, and another read is performed. Once the maximum VBLC or a maximum sense time has been reached, if the read is still not successful, a read failure is reported.


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