The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Aug. 14, 2020
Applicant:

Ansys, Inc., Canonsburg, PA (US);

Inventors:

Myunghoon Lee, Gyeonggi-do, KR;

Vamsi Krishna Yaddanapudi, Maharastra, IN;

Aniket Abhay Kulkarni, Pune, IN;

Assignee:

ANSYS, INC., Canonsburg, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G06F 30/367 (2020.01); G06F 111/10 (2020.01); G06F 119/06 (2020.01); G06F 119/08 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 2111/10 (2020.01); G06F 2119/06 (2020.01); G06F 2119/08 (2020.01);
Abstract

Machine assisted system and method for performing dynamic thermal management (DTM) analysis are described. In one embodiment, the method can include receiving a power profile associated with IP blocks in an integrated circuit (IC) system modeled by a Krylov reduced order model (ROM). The power profile can represent power consumption of each of the blocks based on a predefined operating scenario. The method can additionally include evaluating the temperature of each of the blocks of the IC system for the current time step based on the power profile and the Krylov ROM. The method can further include calculating new power values based on the current temperature field of each of the blocks of the IC system, wherein the power profile can be updated with the new power value for the temperature of each of the blocks of the IC system for the next time step.


Find Patent Forward Citations

Lee, Myunghoon. (2022). Method and system for rom based dynamic thermal management analysis and control (U.S. Patent No. 11250195). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11250195

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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