The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

May. 08, 2019
Applicants:

Chengdu Boe Optoelectronics Technology Co., Ltd., Sichuan, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Cheng Tang, Beijing, CN;

Zebin Sun, Beijing, CN;

Zhen Zhen, Beijing, CN;

Hao Zhang, Beijing, CN;

Shitao Zhang, Beijing, CN;

Xinxing Fan, Beijing, CN;

Xudong Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/00 (2006.01); G03F 7/004 (2006.01); G03F 7/16 (2006.01);
U.S. Cl.
CPC ...
G03F 7/2028 (2013.01); G03F 7/004 (2013.01); G03F 7/0035 (2013.01); G03F 7/16 (2013.01); G03F 7/2004 (2013.01);
Abstract

A photolithography method, a method of preparing a flexible substrate and a photoresist drying device are provided. The photolithography method includes: providing a base substrate on which a material layer to be etched is formed, in which the base substrate includes an intermediate region and a peripheral region surrounding the intermediate region; coating a layer of photoresist on the base substrate, in which the photoresist is coated in the intermediate region and the peripheral region, and is formed to cover the material layer to be etched; and drying the photoresist and simultaneously performing a first exposure process on the photoresist coated in the peripheral region.


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