The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Apr. 15, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Meng-Han Lin, Hsinchu, TW;

Chih-Ren Hsieh, Changhua, TW;

Wei Cheng Wu, Zhubei, TW;

Chih-Pin Huang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11548 (2017.01); H01L 29/423 (2006.01); H01L 21/768 (2006.01); H01L 29/66 (2006.01); H01L 21/033 (2006.01); H01L 23/532 (2006.01); H01L 27/11524 (2017.01); H01L 21/762 (2006.01); H01L 21/321 (2006.01); H01L 27/11534 (2017.01); H01L 29/51 (2006.01); H01L 27/11575 (2017.01); H01L 21/8234 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11548 (2013.01); H01L 21/0337 (2013.01); H01L 21/3212 (2013.01); H01L 21/762 (2013.01); H01L 21/76832 (2013.01); H01L 23/5329 (2013.01); H01L 27/11524 (2013.01); H01L 29/42328 (2013.01); H01L 29/66545 (2013.01); H01L 29/66553 (2013.01);
Abstract

Various embodiments of the present application are directed to a method of forming an integrated circuit (IC). An isolation structure is formed between a logic region and a memory region of a substrate. A dummy structure is formed on the isolation structure and defines a dummy sidewall of the dummy structure facing the logic region. A boundary sidewall spacer is formed covering the dummy structure and at least partially defines a boundary sidewall of the boundary sidewall spacer facing the logic region. A protecting dielectric layer is formed on a top surface of the boundary sidewall spacer by converting an uppermost portion of the boundary sidewall spacer to the protecting dielectric layer. The protecting dielectric layer is removed, and a logic device structure is formed on the logic region.


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