The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Mar. 04, 2019
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Sadayuki Matsumiya, Kanagawa, JP;

Hidemitsu Asano, Kanagawa, JP;

Masato Kon, Kanagawa, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); G01N 23/046 (2018.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/584 (2013.01); A61B 6/032 (2013.01); G01N 23/046 (2013.01); G06T 11/005 (2013.01);
Abstract

When generating a tomographic image using a measuring X-ray CT apparatus that is configured to emit X-rays while rotating a specimen that is arranged on a rotary table and reconstruct a projection image thereof to generate a tomographic image of the specimen, an amount of geometric error that is included in the projection image is obtained in advance and stored; the projection image is corrected using the stored amount of geometric error; and a tomographic image is reconstructed using the corrected projection image.


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