The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Aug. 11, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mikai Chen, Sunnyvale, CA (US);

Murong Lang, San Jose, CA (US);

Zhenming Zhou, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 3/06 (2006.01); G11C 13/00 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0619 (2013.01); G06F 3/0673 (2013.01); G11C 13/0021 (2013.01); G11C 16/0483 (2013.01);
Abstract

A method includes performing a quantity of write cycles on memory components. The method can further include monitoring codewords, and, for each of the codewords including a first error parameter value, determining a second error parameter value. The method can further include determining a probability that each of the codewords is associated with a particular one of the second error parameter values at the first error parameter value and determining a quantity of each of the codewords that are associated with each of the determined probabilities. The method can further include determining a statistical boundary of the quantity of each of the codewords and determining a correlation between the quantity of write cycles performed and the corresponding determined statistical boundary of the quantity of each of the codewords.


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