The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Jul. 23, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Thomas Egloff, Jena, DE;
Tobias Schroeter, Rudolstadt, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A scanner arrangement, suitable for use in laser scanning microscopes, for scanning a scanning field () by means of optical radiation (). It is equipped with at least one scanner (), which comprises a scanning mirror () that is tiltable about one or two scanning axes () and means for rotating the scanning field, for scanning a size-variable scanning field and for centring the scanning field centre () when panning. The arrangement includes a mechanical pivot device () for rotating the scanning field (). The pivot device is arranged to pivot the scanner () about a pivot axis (). Pivoting is implemented through angular dimensions that correspond to an intended rotation of the scanning field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile