The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Feb. 15, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Jörg Siebenmorgen, Jena, DE;
Ralf Netz, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An arrangement for TIRF microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier in a specimen plane via an illumination beam path. An optical axis of the illumination objective includes an illumination angle that differs from zero with the normal of the specimen plane. A detection optical unit with a detection objective in a detection beam path includes a detection angle that differs from zero between an optical axis thereof and the normal of the specimen plane. A transition element between the specimen carrier and both objectives is arranged both in the illumination beam path and in the detection beam path. The transition element corrects aberrations that arise on account of the passage through media with different refractive indices of radiation to be detected and/or radiation for illuminating the specimen.