The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Aug. 10, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Mikai Chen, Sunnyvale, CA (US);
Zhenming Zhou, San Jose, CA (US);
Zhenlei Shen, Milpitas, CA (US);
Murong Lang, San Jose, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 5/06 (2006.01); G11C 5/02 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G11C 29/025 (2013.01); G11C 29/12005 (2013.01); G11C 5/025 (2013.01); G11C 5/06 (2013.01);
Abstract
A method includes determining, for a plurality of memory dice, a signal reliability characteristic and ranking the plurality of memory dice based, at least in part, on the determined reliability characteristics. The method can further include arranging the plurality of memory dice to form a memory device based, at least in part, on the ranking.