The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Dec. 30, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mark Ish, San Ramon, CA (US);

Yiran Liu, Boise, ID (US);

Tom V. Geukens, Longmont, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 12/1009 (2016.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0652 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01); G06F 11/1004 (2013.01); G06F 12/1009 (2013.01); G06F 2212/1032 (2013.01);
Abstract

Methods, systems, and devices for metadata indication are described herein. A method includes receiving, from a host system, a read command to retrieve information from a first block of a memory device, identifying a transfer unit associated with the first block indicated in the read command, identifying an indicator in metadata of the identified transfer unit indicating that at least one sector of the transfer unit has been altered based at least in part on identifying the transfer unit, validating data of the transfer unit stored in the memory device based at least in part on identifying the indicator in the metadata, and retrieving the information stored in the first block based at least in part on validating the data of the transfer unit.


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