The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Oct. 16, 2017
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Tiemo Anhut, Jena, DE;

Matthias Wald, Jena, DE;

Daniel Schwedt, Weimar, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0064 (2013.01); G01N 21/64 (2013.01); G02B 21/008 (2013.01); G02B 21/0024 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G01N 2201/0638 (2013.01);
Abstract

The invention relates to an optical group for detection light of a microscope, in particular a confocal scanning microscope, having an input plane () for the passage of detection light to be measured and having a detection beam path arranged downstream of the input plane for guiding the detection light () into a detection plane (), wherein the detection beam path has at least one first beam course () having first optical beam-guiding means, in particular first lenses and/or mirrors (), for guiding the detection light into the detection plane. In the first beam course, the optical group has at least one dispersive device () for the spatial spectral splitting of the detection light to be measured and a manipulation device () for manipulating the spectrally spatially split detection light. The first optical beam-guiding means together with the dispersive device and with the manipulation device are arranged and designed to produce a spectrally separated and diffraction-limited image of the Input plane into the detection plane. The optical group preferably has a second beam course () having optical beam-guiding means and has a selection device () for selecting the first beam course () or the second beam course (). In further aspects, the invention relates to a method for microscopy and to a microscope.


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