The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Oct. 23, 2020
Applicant:

Rigaku Corporation, Akishima, JP;

Inventors:

Shintaro Kobayashi, Akishima, JP;

Yasukazu Nakae, Akishima, JP;

Takuto Sakumura, Akishima, JP;

Yasutaka Sakuma, Akishima, JP;

Assignee:

RIGAKU CORPORATION, Akishima, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 1/166 (2006.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); G01T 1/1663 (2013.01); G01T 1/171 (2013.01);
Abstract

There are provided a storage sectionthat stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation sectionthat calculates a count value based on the output value that has been read out, wherein the calculation sectionuses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure. According to such a model, the corresponding apparent time constant is able to be obtained even in any higher count rate. As a result of this, reduced can be the influence of count loss even on the count rate that has not been able to be covered by the conventional method.


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