The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

May. 09, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Makarand Ramkrishna Kulkarni, Dallas, TX (US);

Tae Kim, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/56 (2006.01); H01L 23/31 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/563 (2013.01); H01L 23/3114 (2013.01); H01L 23/3121 (2013.01); H01L 24/11 (2013.01); H01L 24/27 (2013.01); H01L 24/29 (2013.01); H01L 24/32 (2013.01); H01L 24/73 (2013.01); H01L 2924/14 (2013.01);
Abstract

A method of assembling a flip chip IC package includes applying core underfill material to a surface of a package substrate in a pattern including an area corresponding to a core region of an IC die thereon that is to be attached, that excludes of an area corresponding to corners of the IC die. The IC die is bonded to the package substrate by pushing the IC die with a sufficient force for the core underfill material is displaced laterally by the bumps so that the bumps contact the land pads. After the pushing the corners of the IC die are not on the core underfill. Edge underfilling includes dispensing a second underfill material that is curable liquid to fill an area under the corners of the IC die. The second underfill material is cured resulting in it having a higher fracture strength as compared to the core underfill.


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