The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Aug. 28, 2019
Applicant:

SK Siltron Co., Ltd., Gumi-si, KR;

Inventors:

Do-Won Song, Gumi-si, KR;

Hong-Woo Lee, Gumi-si, KR;

Sang-Hee Kim, Gumi-si, KR;

Ho-Jun Lee, Gumi-si, KR;

Jung-Ryul Kim, Gumi-si, KR;

Assignee:

SK SILTRON CO., LTD, Gumi-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 15/22 (2006.01); C30B 29/06 (2006.01); C30B 15/20 (2006.01); C30B 15/30 (2006.01); C30B 30/04 (2006.01);
U.S. Cl.
CPC ...
C30B 15/22 (2013.01); C30B 15/20 (2013.01); C30B 15/305 (2013.01); C30B 29/06 (2013.01); C30B 30/04 (2013.01);
Abstract

The present invention relates to an apparatus for growing a single crystal ingot capable of uniformly controlling an oxygen concentration in a longitudinal direction and a radial direction of a single crystal ingot by uniformly maintaining a convection pattern on a silicon melt interface, and a method for growing the same. In an apparatus for growing a single crystal ingot and a method for growing the same according to the present invention, a horizontal magnet is positioned to be movable up and down by a magnet moving unit around a crucible, so that a maximum gauss position (MGP) is positioned to be higher than the silicon melt interface and simultaneously, a rate of increase in the MGP is controlled to 3.5 mm/hr to 6.5 mm/hr, and thus it possible to secure simplicity and symmetry of convection on the silicon melt interface. Accordingly, in the present invention, it is possible to reduce an Oi deviation and a BMD deviation in a longitudinal direction and a radial direction of a single crystal ingot, thereby improving quality.


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