The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Jun. 05, 2019
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Haowen Ruan, Pasadena, CA (US);

Haojiang Zhou, Los Angeles, CA (US);

Yuecheng Shen, Guangdong, CN;

Roarke Horstmeyer, Durham, NC (US);

Assignee:

HI LLC, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); H04N 5/30 (2006.01); G01J 1/44 (2006.01); G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0042 (2013.01); A61B 5/0075 (2013.01); A61B 5/6803 (2013.01); G01J 1/0425 (2013.01); G01J 1/44 (2013.01); H04N 5/30 (2013.01); A61B 2562/0238 (2013.01); A61B 2576/026 (2013.01); G01J 2001/442 (2013.01); G01J 2001/448 (2013.01); G01J 2001/4466 (2013.01);
Abstract

An exemplary non-invasive measurement system includes a single-photon counting camera and a processor. The single-photon counting camera includes an array of SPAD detectors configured to detect, during a sequence of gated time intervals, coherent continuous light that exits a body after the light enters and scatters within the body, and output a plurality of electronic signals representative of the detected light. The processor is configured to generate, based on the electronic signals, a sequence of speckle pattern image frames corresponding to the gated time intervals. Other exemplary non-invasive measurement systems are also described.


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