The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Jul. 08, 2020
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Evgeny Mekhanik, Rehovot, IL;

Tomer Tzvi Eliash, Sunnyvale, CA (US);

Barak Goldberg, Kfar Saba, IL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G01K 3/08 (2006.01); G11C 29/38 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G01K 3/08 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01); G11C 29/38 (2013.01);
Abstract

A method, device, and system for improving read performance in frequently changing device temperature conditions through detecting thermal region tags and thermal region outliers in a memory device. A plurality of thermal regions may be configured for the memory device. A first temperature may be measured corresponding to opening a storage block of the memory device for programming. A second temperature may then be measured corresponding to closing the storage block for programming. A range between the first temperature and the second temperature may be determined. The range may span N≥2 of the thermal regions. Finally, the storage block may be assigned to a thermal region that includes the second temperature, on condition that N satisfies a threshold.


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