The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Feb. 14, 2019
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Yu-Hsin Hsu, Taichung, TW;

Hao-Ming Chang, Pingtung, TW;

Shao-Chi Wei, Hsinchu, TW;

Sheng-Chang Hsu, New Taipei, TW;

Cheng-Ming Lin, Yunlin County, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/40 (2006.01); G03F 1/82 (2012.01);
U.S. Cl.
CPC ...
G03F 7/40 (2013.01); G03F 1/82 (2013.01);
Abstract

A method for manufacturing a photomask is provided. The method includes: receiving a substrate having a hard mask disposed thereover; forming a patterned photoresist over the hard mask; patterning the hard mask using the patterned photoresist as a mask; and removing the patterned photoresist. The removing of the patterned photoresist includes: oxidizing organic materials over the substrate; applying an alkaline solution onto the patterned photoresist; and removing the patterned photoresist by mechanical impact. A method for cleaning a substrate and a photomask are also provided.


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