The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Jul. 08, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Amit Berman, Binyamina, IL;

Evgeny Blaichman, Tel Aviv, IL;

Ron Golan, Shoham, IL;

Sergey Gendel, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/12 (2006.01); H03M 13/39 (2006.01); G06N 20/00 (2019.01); G11C 7/06 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G06N 20/00 (2019.01); G11C 7/06 (2013.01); G11C 29/12005 (2013.01); G11C 29/44 (2013.01); H03M 13/3927 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01);
Abstract

A memory system including a memory device and a memory controller including a processor. The memory controller is configured to read outputs from the memory cells in response to a read command from a host and to convert the read outputs to a first codeword. The processor performs a first error correcting code (ECC) operation on the first codeword. The processor is further configured to apply, for each selected memory cell among the memory cells, a corresponding one of the read outputs and at least one related feature as input features to a machine learning algorithm to generate a second codeword, and the memory controller is configured to perform a second ECC operation on the second codeword, when the first ECC operation fails.


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