The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Aug. 22, 2019
Advantest Corporation, Tokyo, JP;
Jochen Rivoir, Magstadt, DE;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A tester for testing a device under test is shown, having a test unit configured for performing a test of the device under test using multiple test cases, each test case having variable values of a set of predetermined variables, the test units configured to derive an output value for each test case indicating whether the device under test validly operates at a current test case or whether the device under test provides an error at the current test case; and an evaluation unit configured for evaluating the multiple test cases based on a plurality of subsets of the predetermined input variables with respect to the output value, the evaluation unit configured for providing a number of plots of the evaluation of the multiple test cases where each plot indicates the impact of one subset of the plurality of subsets of the predetermined input variables to the output value in dependence on respective relevance scores or associated with the respective relevance scores.