The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Dec. 31, 2018
Micron Technology, Inc., Boise, ID (US);
Randall J. Rooney, Boise, ID (US);
Gregg D. Wolff, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Methods, systems, and apparatuses related to detecting and reporting failures for a memory device are described. When a count of bit-flip errors is above a fail threshold, a memory device can report a failure. Failure reports can indicate a rate at which the memory device is accumulating errors. An offset fail threshold may be applied instead of a default fail threshold, such as a standardized or specified threshold. The offset fail threshold can be a summation of the default fail threshold and an offset determined from an initial error count determined before the memory device has accumulated errors from use.