The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Sep. 02, 2020
Integrated Silicon Solution Inc., Milpitas, CA (US);
PaiLu Dennis Wang, Milpitas, CA (US);
Lien-Sheng Yang, Milpitas, CA (US);
INTEGRATED SILICON SOLUTION INC., Milpitas, CA (US);
Abstract
A memory inspecting method and a memory inspecting system are proposed. The memory inspecting system includes a testing machine and a computer system. The memory inspecting method includes: performing a first data retention time test on a plurality of memory chips to obtain a plurality of first qualified memory chips; performing a second data retention time test on the first qualified memory chips to obtain a plurality of second qualified memory chips; performing a third data retention time test on the second qualified memory chips to obtain a plurality of third qualified memory chips. Performing a statistical analysis step on the third qualified memory chips according to a first data retention time, a second data retention time and a third data retention time of each of the third qualified memory chips is for obtaining at least one final qualified memory chip.