The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11193972 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 07, 2021

Filed:

Jan. 06, 2020
Applicant:

Siliconware Precision Industries Co., Ltd., Taichung, TW;

Inventors:

Bo-Siang Fang, Taichung, TW;

Kuan-Ta Chen, Taichung, TW;

Hsinjou Lin, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2887 (2013.01); G01R 31/2896 (2013.01);
Abstract

An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.


Find Patent Forward Citations

Fang, Bo-Siang. (2021). Inspection equipment for an over the air testing process and testing device thereof (U.S. Patent No. 11193972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11193972

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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