The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Dec. 11, 2019
Anritsu Infivis Co., Ltd., Kanagawa, JP;
Junichi Tamura, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
An article inspection apparatus includes a measuring unitthat outputs a measuring signal of weight within a required measurement time from a weight application time, when the weight of an article W is applied, a determination unitthat inspects the article W based on the measuring signal, an electromagnetic coilthat applies a diagnostic load to the measuring unit, and a performance diagnosis unitthat causes the diagnostic load to be applied from the electromagnetic coilto the measuring unit, within a predetermined diagnosable time longer than the required measurement time from the weight application time, when the weight of the article W is applied to the measuring unit, and diagnoses the performance of the measuring unit, based on the measuring signal when the diagnostic load is applied.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile