The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Dec. 05, 2019
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Nidhi Sinha, Noida, IN;

Garima Sharda, Noida, IN;

Dinesh Joshi, Delhi, IN;

Akshay Pathak, Noida, IN;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G11C 29/44 (2006.01); H03K 5/1534 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/44 (2013.01); H03K 5/1534 (2013.01);
Abstract

A system-on-chip (SoC) includes a processor, a built-in self-testing (BIST) circuitry, and an adaptive masking circuitry. The processor generates a sweep enable (SWEN) signal to initiate a self-testing operation of the SoC. The BIST circuitry receives the SWEN signal and generates a set of sweep events, such that a transition of the processor from a low power (LP) mode to an active mode is initiated based on the generation of each sweep event. The BIST circuitry further receives a status signal, and identifies a subset of sweep events at which the transition of the processor from the LP mode to the active mode failed, for generating sweep failure data. The adaptive masking circuitry receives the sweep failure data and generates a mask signal, to prevent a transition of the first processor from the LP mode to the active mode, during a non-testing operation of the SoC.


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