The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Mar. 20, 2018
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Andrew Kingston, Holder, AU;

Olaf Delgado-Friedrichs, Turner, AU;

Glenn Myers, Waramanga, AU;

Shane Latham, Griffith, AU;

Adrian Sheppard, Fisher, AU;

Trond Varslot, Oslo, NO;

Petr St{hacek over (r)}elec, Brno, CZ;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/419 (2013.01);
Abstract

Methods and apparatuses are disclosed herein to correct for inconsistencies in CT scans based on pi-lines. An example method at least includes acquiring a plurality of projections of a sample, each projection of the plurality of projections acquired at a different location around the sample based on a trajectory, determining pairs of opposing projections from the plurality of projections based on a respective pi-line, and determining an amount of inconsistency between respective pi-line data for each pair of opposing projections, where the pi-line data is based, at least in part, on attenuation data.


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